ipTEST have developed a 400A, 1kV Clamped Inductive Load (CIL) adaptor that performs dynamic switching tests on high speed devices like GaN and SiC as well as conventional Mosfets and IGBT devices at production speeds.

The CIL adaptor plugs into the output of the M2 Dynamic Switch generator DS5 Power board and allows the generator to be placed very close to the handler Device Under Test (DUT) contacts to ensure parasitic inductances & capacitances are minimised. Switching time measurements like dV/dt, dI/dt, ton, toff, tdelay and short circuit current can be performed with typical test times of 50ms.

CIL tests can be performed up to 400A and short circuit tests up to 500A with 3 test-selectable inductors mounted in a separate inductor box.

Other features are:

Programmable voltage clamp up to 1000V
Programmable gate resistances up to 255 ohms in 1 ohm steps with optional pluggable fixed value resistors
Electronic ID for remote interrogation of system configuration
Programmable gate driver up to +/-20V
On-board Kelvin test with 30 ohm resistance measurement range
On-board current measure transformer (5000A peak rating)
3nF high voltage snubber capacitors
Releasable magnetic base attachment to handler table
High saturation open-core inductors with nominal values 100uH / 300uH / 1000uH
High speed shunt switch for rapid turn-off in the event of DUT failure
SEMI-S8 compliant safety features with interlocked safety cover.

For more information, contact your ipTEST representative or use the Contact us form to request more details.