M2

Customer training area now live

ipTEST have launched a new training area on our website for customers to gain easy access to training information. The online training courses are delivered in video form and cover everything from understanding textmodes, preventative maintenance and even programming examples.

The information is free to access to all ipTEST customers and is accessed here: https://www.iptest.com/training-area

There are 3 sections to the training:

  1. M2 Hardware installation (system install and individual board overview)

  2. Test modes (background theory and how to programme each test)

  3. Preventative Maintenance

For further information on accessing this content please email sales@iptest.com

M2 DS5 Short Circuit Apps Adapter

ipTEST have concluded the development of the DS5 short circuit apps adapter that enables us to perform high speed stress tests on the new generation of semiconductor devices, adapting conventional component handling equipment previously considered inadequate for such testing, thereby providing greater productivity at lower cost. For more information please see our M2 webpage.

M2 Four Slot Backplane

Today ipTEST announced an extension to the M2 system architecture. The M2 four slot backplane allows simultaneous control of multiple resources in a single enclosure, thereby reducing cost and increasing efficiency. Most importantly, it allows extra test card generators to be added to a system at a later date. This means test systems can be upgraded or boosted with additional current sources.

4 slot backplane.PNG

M2 Trr Tester

ipTEST has completed redesign of an existing Trr generator (reverse recovery test) but using the new M2 control architecture to achieve significantly lower cost-of-test and massively higher throughput. The system uses a small footprint test head to allow the distance to the handler to be significantly reduced.

M2 Trr.png

M2 DS5 generator

ipTESt are delighted to announce a new M2 product development for performing dynamic tests on all types of semiconductor devices. The DS5 improves on the performance of the DS4 product in terms of measurement accuracy and throughput. It also reduces the footprint of the system and allows the test head to be brought in close proximity to the handler units.

DS5.PNG