Production-focussed back-end and wafer test products for power discrete testing

MOSTRAK has 30+ years’ testing experience built-in and is the established leader in high speed, broad coverage parametric device testing.

The new MOSTRAK-2 (M2) product line from ipTEST builds on that testing know-how and further increases throughput, test coverage and accuracy in a small footprint to be able to get closer to the device under test to perform measurements on high-speed technologies such as Gallium Nitride (GaN) and Silicon Carbide (SiC).

High Speed Power Electronics Testing

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The Mostrak2 or M2 test generators build upon the legacy of the ipTEST Mostrak and T2 production testers for power discrete semiconductors. Our products are designed for maximum productivity back end testing.

The aim of the M2 range is to provide customers which higher efficiencies and ability to use a modular test system. The M2 can be configured to suite a range of handlers and has a range of new features which offer the following benefits

  • more flexible test solution

  • improved accuracy

  • improved productivity

  • improved reliability

  • improved test coverage

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