Wafer, KGD, Final Test and Laboratory Testing

ipTEST has 30+ years’ testing experience and is the established leader in high speed, broad coverage parametric device testing.

ipTEST M2 builds on that testing know-how to offer high throughput, comprehensive test coverage and accuracy in a small footprint. Ideal for modern high-speed wide bandgap Gallium Nitride (GaN) and Silicon Carbide (SiC).

High Speed Power Electronics Testing

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The M2 test platform builds upon the legacy of the ipTEST Mostrak production testers for power discrete semiconductors. Our products are designed for maximum productivity front end, back end and laboratory testing.

M2 provides customers with higher efficiencies and an easy to use, modular test system. The M2 can be configured to suite a range of handlers and has a range of new features which offer the following benefits

  • more flexible test solution

  • improved accuracy

  • improved productivity

  • improved reliability

  • improved test coverage

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