ipTEST was founded specifically to design and build production line testers for Integrated Device Manufacturers (IDMs) of discrete power semiconductors.

Our first Mostrak tester introduced in 1987 was the world's first indexed parallel test system, offering production throughput increases between 2 and 4 times the output of competitive systems for both wafer and back-end. Continuous development means that our Mostrak product line continues to grow faster, flexible and more accurate with each generation whilst offering greater flexibility and more comprehensive coverage than ever before.

ipTEST history has been shaped by a continuous commitment to Research and Development, led by the demands of our customers with time-to-market and responsiveness a priority.

The engineers at ipTEST are continuously developing new test resources, as well as incrementally developing of ipTEST products new and old, in response to our customers' needs.

Here are some of our significant milestones along the way…

  • 2021 Introduced the M2 DS5 1200A/1200V dynamic switch generator

  • 2020 Introduced the M2 LV 400A+ test generator

  • 2019 Introduced the M2 400A dynamic switch & short-circuit test adaptor

  • 2018 Introduced the M2 LV 200A generator

  • 2107 Introduced the M2 DS5 dynamic switch generator targeted at SIC & GaN devices

  • 2017 Introduced the M2 Trr tester

  • 2016 Introduced the first M2 product, the M2 3kV HV generator

  • 2015 Linux industrial PC released to complement the HPE Itanium server

  • 2014 Development of the new Mostrak-2 architecture

  • 2012 Added 11- and 12-pin package test capability

  • 2010 First full-bridge power module tester shipped

  • 2009 New 8kV and 10kV test generators introduced

  • 2006 Introduction of HPE Itanium host controller

  • 2004 SO8 package test capability added to all resources

  • 2003 Fast MOSFET gate resistance (Rg) generator introduced

  • 2002 Introduced ultra-low sub-1mOhm Rds(on) MOSFET testing

  • 2002 Received the Queen's Award for Enterprise

  • 2000 Test cell control integration software introduced

  • 1999 Demonstrated first dynamic wafer testing for IGBTs

  • 1997 New Linear voltage regulator generator introduced

  • 1995 New dynamic switching test generator introduced