Dynamic Switching Tests
DS5 Dynamic Switch 1000A Test Generator
The DS5 high-speed dynamic switching test generator was developed specifically to meet the needs of the latest Si, SiC and GaN IGBT and MOSFET devices.
The M2 DS5 1000A dynamic switch test generator assembly is one of the Mostrak-2 family of test generators from ipTEST. It performs single and double pulse inductive load switching, diode recovery and short-circuit tests on MOS and IGBT discrete power semiconductor devices up to 1200V and 1000A.
The DS5 generator provides the architecture for a complete dynamic switch test cell, such as programmable power supplies, gate drives, auxiliary drives and over-current protection.
System Architecture
The M2 architecture allows up to eight independent test generators to be accommodated within a single system. These can be grouped and assigned to handlers or probers through up to four control interfaces. Each test generator is a self contained application-specific tester that includes:
Dual microcontroller for test plan storage and execution
16-bit A-D converter and quad D-A converters
Automatic self check
All critical test circuitry is contained in a compact, remote low inductance test head, designed for handler mounting with minimal interface distance.
Applications Adaptor
The generator is used in conjunction with a range of different application adaptors, such as the H-bridge 1200V/1000A adaptor, which provides high speed voltage and current waveform capture, inductive load, gate drive and programmable gate resistance along with a replaceable auxiliary device. ipTEST designs unique adaptors for each specific customer application.
DS5 Test Capabilities
High speed test algorithms and data processing allow full dynamic characterisation in under 200ms, and combinations of tests at handler compatible rates.
DSIND Dynamic switching inductive load single pulse clamped inductive load test, or a double pulsed test for both turn-on and turn-off measurements.
DSSC Dynamic switching short circuit test ('ISC' test). The Auxiliary device is switched on for the test so this part must have a substantially higher pulsed current capability than the Device Under Test (DUT).
DSDRC Diode recovery test. The Auxiliary device is switched on with an inductive load for the DSDRC and it will typically be similar to the DUT.
DS5 Specifications
Current measure:
Voltage measure:
