M2 DS6 Pulsar
Dynamic Switch Test Generator
Test Wide Bandgap Devices such as SiC MOSFETs, JFETs, half-bridges and diodes to automotive quality standards such as AEC-Q101 and AQG 324. DS6 Pulsar performs dynamic switch tests at high currents up to 7,500A at KGD, discrete and module stages of manufacture. DS6 Pulsar’s ultra fast switching speeds recreate high current stress conditions that devices will experience during automotive operation.
A hard dock handler interface ensures fast slew rates, critically damped waveforms and stray test inductance of typically 20-40 nH. SocketSafeTM technology protects the test cell should a device catastrophically fail during test, perfect for wide bandgap power technologies so you can ship highest quality, conforming product.
PERFORMANCE - PUSHING TEST LIMITS
Short Circuit testing up to 7,500 A, specifically engineered for automotive applications, simulating real-life stress events such as shoot-through. Hard dock interfacing allows the device under test to be plugged in closer to the test station, minimizing parasitic inductance. 20-40 nH typical parasitic inductance for ultra fast switching speeds with minimal overshoot. This significantly improves test ramp times without the risk of voltage overshoot exceeding the device’s limits.
TESTING FLEXIBILITY
Cost effective and efficient, invest in DS6 Pulsar to perform a wide range of tests on one hardware platform. Easily redeploy to other handlers and DUT types by just changing the interface daughterboard.
These custom-made daughter boards are easily interchangeable and integrate with DS6 Pulsar’s hardware, allowing seamless integration and perform all tests on a single platform.
OVERCURRENT PROTECTION
Protect your Investment with SocketSafeTM technology that safeguards the contactor and test generator should the device under test develop a fault. Energy is swiftly removed from the device and tester, minimizing the need for contactor repairs, saving on maintenance costs and maximising uptime and UPH.