The new DS5 dynamic switching test generator designed for testing the latest 1200V, 1000A high speed power electronics devices.
M2 test system adds 400A+ capability
M2 400A Clamped Inductive Load dynamic switch generator with short-circuit test for high-speed device testing
M2 DS5 Mk2
The development of the M2 DS5 Mk2 gives an appreciable improvement to the performance of the DS5 product, to extend its capability to higher currents and improve robustness in the presence of potentially damaging energy pulses.
M2 DS5 Short Circuit Apps Adapter
ipTEST have concluded the development of the DS5 short circuit apps adapter that enables us to perform high speed stress tests on the new generation of semiconductor devices, adapting conventional component handling equipment previously considered inadequate for such testing, thereby providing greater productivity at lower cost. For more information please see our M2 webpage.
M2 Four Slot Backplane
Today ipTEST announced an extension to the M2 system architecture. The M2 four slot backplane allows simultaneous control of multiple resources in a single enclosure, thereby reducing cost and increasing efficiency. Most importantly, it allows extra test card generators to be added to a system at a later date. This means test systems can be upgraded or boosted with additional current sources.
M2 3kV HV generator
ipTESt are announcing a new product development to test high voltage parameters of new generation semiconductor devices, using an innovative architecture which leads the way to a new system architecture. The M2 test system is a modular approach that can allow expansion of test capabilities when required.
M2 Trr Tester
ipTEST has completed redesign of an existing Trr generator (reverse recovery test) but using the new M2 control architecture to achieve significantly lower cost-of-test and massively higher throughput. The system uses a small footprint test head to allow the distance to the handler to be significantly reduced.
M2 DS5 generator
ipTESt are delighted to announce a new M2 product development for performing dynamic tests on all types of semiconductor devices. The DS5 improves on the performance of the DS4 product in terms of measurement accuracy and throughput. It also reduces the footprint of the system and allows the test head to be brought in close proximity to the handler units.