M2 3kV HV generator

ipTESt are announcing a new product development to test high voltage parameters of new generation semiconductor devices, using an innovative architecture which leads the way to a new system architecture. The M2 test system is a modular approach that can allow expansion of test capabilities when required.

M2 Trr Tester

ipTEST has completed redesign of an existing Trr generator (reverse recovery test) but using the new M2 control architecture to achieve significantly lower cost-of-test and massively higher throughput. The system uses a small footprint test head to allow the distance to the handler to be significantly reduced.

M2 DS5 generator

ipTESt are delighted to announce a new M2 product development for performing dynamic tests on all types of semiconductor devices. The DS5 improves on the performance of the DS4 product in terms of measurement accuracy and throughput. It also reduces the footprint of the system and allows the test head to be brought in close proximity to the handler units.