See our latest testers in action at PCIM!

It's an exciting time for power electronics right now with the adoption of wide bandgap SiC and GaN semiconductors. GaN is enabling a new generation of super compact chargers that are smaller, lighter and more energy efficient. SiC allows higher powers to be switched at higher operating temperatures and operating efficiencies than ever before. Si based power devices continue to evolve.

SiC, GaN and Si push the envelope of power device performance and accurately testing and characterizing high power packages and modules during manufacture has never been so important. And as wide bandgap devices go to higher power and switching speeds, the power tester must also meet those needs.

At ipTEST we are proud to supply production testers that specifically meet the testing needs of SiC, GaN and Si high power devices.

Meet us at PCIM in Nuremburg Messe to find out more - hall 7, stand 475.