Unclamped inductive switching (UIS or UIL) is an avalanche test typically performed to verify the ruggedness of power MOSFETs and the associated rectifier diodes.

The UIS test generator performs avalanche testing at currents up to 200 A, and avalanche voltages to 2500 V. The unit is designed to work with the latest generation of high current, low voltage MOSFETs with an architecture capable of driving 200 A on MOSFETs with V_(BR)DSS as low as 12 V. The UIS may be easily added to an existing test system.

Fully programmable

• Fully programmable load inductor from 10 uH to 25 mH.
• Additional programmable custom inductors available to 300 mH.
• Fully programmable gate drive to ±30 V, ±5 A.
• A programmable output matrix for various package pin configurations.
• Programmable set of voltage and current window comparators for high speed production testing.
• A programmable high resolution waveform capture unit to analyse waveforms and measure the avalanche energy.
• A programmable energy cut off mode to guarantee the correct avalanche energy regardless of the tester losses.
• Over current and selectable over voltage clamp circuits to prevent damage to contacts and probe needles on device failure.
• Programmable output matrix for various pin configurations.
• Built in Kelvin and leakage test circuits.

On-screen switching waveforms

On-screen switching waveforms may be used for avalanche energy measurement and as a diagnostic aid.