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Static Parameter tests

 
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High Voltage (HV) test generator

The HV test generator performs high voltage breakdown and low leakage current measurements. The generator has a high voltage forcing capability of up to ±2000 V and has a current measure capability with a picoampere resolution. The high voltage sources and control elements are mounted in the Mostrak system mainframe with a remote test head mounted on the handler contact (or a serial test head for wafer probe).

The HV has a programmable voltage clamp and a programmable current clamp to prevent excessive over voltages and over currents on the device under test. The generator has also been designed to give the fastest test time with a dv/dt ramp control to prevent excessive charging currents when measuring leakage currents of capacitive junctions such as the gate of a MOSFET.


Low Voltage (LV) test generator

The Low Voltage test generator performs on-state high current measurements. The test generator has two independent voltage sources for the drain and gate supplies.