The Dynamic Switching test generator has been developed specifically to meet the needs of the latest discrete IGBT and MOSFET devices.

The following test modes are available:

• Inductive load switching; 200 A, 30 V to 1500 V
• Resistive load switching; 200 A, 30 V to 1500 V
• Avalanche energy test; (UIS) 200 A, 10 V to 100 V
• Short circuit test to 500 A
• Diode recovery tests
• Gate charge tests

Two Vcc supplies are provided, permitting high speed tests for combinations of different conditions without significant loss of throughput. All critical test circuitry is contained in a compact, remote, low inductance test head, designed for handler mounting with minimal interface distance.

High speed test algorithms and data processing allow full dynamic characterisation in under 200 ms, and combinations of tests at handler compatible rates.

Waveform storage with 1 ns resolution gives on-screen switching waveforms.