How does the production operator cope with the full flexibility and functionality of the ipTEST system?

The answer is to use the built-in automation features which set up the production & QA test programs, the laser marker, the vision system, and resets the handler all from a simple bar-code input

ipTEST has introduced a number of features to make the production use of the tester as simple as possible. This includes:

• Learn key macros to automate repeated tasks
• Bar Code input
• Test Cell Control
• Network Capability
• Context sensitive help in a HTML browser with a search facility
• Template test programs
• Off-line binning for wafer probing

Automated tasks reduce human error

Learn key macros

ipTEST provides a learn key macro feature to simply automate repeated tasks. Each ipTEST application has the ability to remember the user inputs and store these in a macro file. The macro file is assigned to a personal function (PF) key, with an associated descriptive text.

The production benefit are a reduced number of key strokes and simple operator training.

For example, the PF1 key may activate a "START" macro which starts a run, enables datalogging to a user defined directory and enables the wafer map. PF4 maybe a "STOP" macro, which stops the Run, stops the Datalog, and prints the lot summary information. Simply selecting the keyboard PF key will activate the macro, the key will flash green during the macro execution.

The personal function key macros may also be copied to a Functional Learn Sequence. The learn sequence number or name may be used to automatically run a learn macro from a barcode start or a test cell controller application.

Production control by Barcode Scanner

Barcode input

Barcode data entry may be used to reduce operator error and to automate the START and END testing processes.

ipTEST can provide a barcode scanner feature with the test system to improve production efficiency. Typically the device type, the device lot number and the date code may be entered directly from the batch traveller using the barcode scanner. The tester will load the correct test program for the production test and in-line QA automatically and run any associated functional learn sequence to start testing. The test plans may be loaded from the local tester or from a network server.

The benefits for the user are the reduced time for data entry in changing the production lot, and the avoidance of operator errors in both typing and in selecting the test programs. This feature may be extended to include full control for the test cell, using the Test Cell Controller software.

A simple text file is used to associate the correct production test plan and QA test plans with the device type.

The START learn key sequence is run automatically, the END sequence is run either by scanning or by selecting from the Run screen.

The tester cannot be separated from the automation

Test Cell Controller

ipTEST has introduced the Test Cell Controller software to automate setting up of all the elements in a test cell to improve the overall productivity of a production line by up to 30%. The supervisory software shell orchestrates the test cell set up on any lot change, and organise the summary data at the lot end.

The test cell may include various elements including multiple testers, automatic handlers, laser marker, vision system etc. On any production lot change the test programs for the new lot need to be loaded for both production and in-line QA, the handler needs to be purged and all the bin counters reset, the Laser mark files need updating and the vision inspection template needs to be reset. Manually resetting all these items may take up to 30 minutes and reduce the productivity especially on a line with a low volume high mix of products. The Cell controller reduces this time to seconds.

Supporting the Laser Mark system

Laser mark files

The laser mark templates and files are supported in the set-up.

Networked systems for program and data management

Network management

ipTEST systems support full network compatibility. The benefit for users is the ease of transfer of data filed to a network database, and the ease of program management.

A manufacturing line has many systems installed, one tester can be configured as a network server and provide test plans to the client test cells. If say there are 40 testers installed and the test program needs to be changed, the file need only be changed on one machine, and uploaded to the server. The next time a local machine runs, it may be set to look for the authorised version of the test plan on the server.

Remote access for program creation and data analysis

Remote access

ipTEST Mostrak supports multiple user access. A remote user may log on to the tester via a local area network either using terminal emulation software which supports the TELNET or CTERM protocols.

File transfer over the local area network (LAN) can be achieved either by using a simple file transfer protocol (FTP) or by using a mapped drive from the PC (using the SMB or NFS protocols). If you have any further questions regarding networking and the ipTEST products, please contact your ipTEST representative for further information.

Context sensitive help

The tester user guide and software manuals are written in HTML and may be viewed in any web browser. The manuals are fully indexed to aid navigation and the index is context sensitive. At any point in the software pressing the link in the top right hand corner of the window will open the most relevant section of the manual in a browser window. Alternatively select the Manuals icon to open the manuals at the home page.

There is also a search facility which will list all the pages containing the search text.

Example help screen showing the test modes index:

Example help screen showing the test parameters:

Template test programs

ipTEST has developed a range of test program templates for production testing. The programs are written to include Kelvin, opens and shorts testing and the test sequence optimised to reduce the test time. These may be used as a "blue print" for new users to speed program development.

Off-line Binning for wafer probing

ipTEST supports off-line binning, a feature which runs a part average testing (PAT) process across the measured data to eliminate any device which has a variation greater than a 3 sigma from the average of the measured parameters. This is used as an additional process quality control.