| Avalanche UIS Programmable Inductor
Range Extended |
March 2004
|
A new option is available to extend the range of integral,
programmable inductors, up (from 12.5uH -25mH) to 200mH,
and retaining the same 12.5uH resolution.
| On-Line PAT (Part Average Testing) |
January 2004
|
PAT is now available for both on and off-line use at both
Wafer and Backend Test.
| Testing Rg On Power MOSFETs |
December 2003
|
On-line Rg testing is now available on Mostrak as an integral
test on any system. Highlights as follows:
- Range 1 ohm upwards with 0.05ohm resolution.
- Fast measurements. Total added test time is ~8ms.
- Accurate for mosfets with Ciss as low as 100pF.
- Ciss measure available.
- Retrofit or original. Can be integral with HV static
load box, HV/LV static load box, or as stand-alone head.
- Available on 8 week delivery time.
| Low RDS(ON) Accuracy Improved |
June 2003
|
All new low voltage static test generators have an improved
RDS(ON) measure circuit to improve accuracy on latest generation
mosfets. Available as a retrofit.
|
